Scanning Electron Microscope (SEM) Analysis

Scanning Electron Microscope (SEM) Analysis

Solar Atmospheres offers value-added SEM analysis in support of heat treat operations. Our Hitachi Smart Flex SEM1000II scanning electron microscope has energy dispersive X-ray Spectroscopy (EDS) capability in order to characterize the elemental composition of the sample under investigation. When solving a challenge that requires resolution beyond what traditional metallography can resolve, SEM analysis provides the next level of scrutiny.

Scanning Electron Microscope (SEM)

Available at our Souderton, Pennsylvania facility.


Watch our video demonstrating the capabilities of the SEM, a couple examples of the value in detecting material characterizations and metallurgical evaluations.

For additional information, contact Mike Moyer, Director of Sales, Solar Atmospheres, at 215-721-1502 x1207, or

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